Second International Workshop on Random Testing (RT 2007)
Atlanta, Georgia, USA, November 6, 2007
 
co-located with ASE 2007

News

Program

Invited Talk

Theme and Goals

Topics of Interest

Contributions

Important Dates

Committees

Contact

Program
9:00 - 9:15 Welcome
9:15 - 10:30 Invited Talk
(Chair: ?)

Random Testing for Security: Blackbox vs. Whitebox Fuzzing
Patrice Godefroid (Microsoft Research, Redmond, USA)

10:30 - 11:00 Coffee Break
11:00 - 12:30 Session 1: Adaptive Random Testing
(Chair: ?)
  • Adaptive Random Testing by Balancing
    T. Y. Chen, De Hao Huang, F.-C. Kuo (Swinburne University of Technology, Australia)
  • Improving Random Test Sets Using the Diversity Oriented Test Data Generation
    Paulo M. S. Bueno (Renato Archer Research Center, Brazil), W. Eric Wong (University of Texas at Dallas, USA), Mario Jino (State University of Campinas, Brazil)
12:30 - 14:00 Lunch Break
14:00 - 15:30 Session 2: Combinatorial Testing Techniques
(Chair: ?)
  • Directed Random Reduction of Combinatorial Test Suites
    Frederic Dadeau, Yves Ledru, Lydie Du Bousquet (Laboratoire d'Informatique de Grenoble, France)
  • Uniform Random Walks in Very Large Models
    Johan Oudinet (LRI, Universite Paris-Sud, France)
15:30 - 16:00 Coffee Break
16:00 - 17:30 Session 3
(Chair: ?)
  • Random Testing: From the Classical Approach to a Global View and Full Test Automation
    Ralf Gerlich, Rainer Gerlich, Thomas Boll (BSSE, Germany)
  • Parameterizing Random Test Data According to Equivalence Classes
    Christian Murphy, Gail Kaiser, Marta Arias (Columbia University, USA)
17:30 - 18:00 Discussion Session
(Chair: RT Chairs)

General discussion and plans for the future

18:00 Closing